NTNU-RESIW-SEM

By /

NTNU Scanning Electron Microscopy

TA43 – NTNU-RESIW-SEM 

Location

Alfred Getz vei 2b

7491 Trondheim,  Norway 

Description

SEM-Scanning Electron Microscopy:

For microstructure (SE, EBSD modes) and chemical analysis (EDS):

Magnification:
• 10X – 300.000X
• Detectors:
• Secondary Electron Detector, SE
• Solid State Backscattered Detector,

BSE
• NORDIF EBSD Detector
• NORDIF Absorbed Electron

Detector
• Image recording and analysis system:
• Digitised Images

Testing Capabilities

Microstructure analysis: grain size and morphology, grain orientation.
Correlation between microstructure and properties.
Analysis of impurities, intermetallics and precipitates.
EDS detector allows chemical analysis of a selected area inside the sample.

Technical Equipment

This facility is at the Department of Materials Science and Engineering at NTNU, the Norwegian University of Science and Technology (Trondheim, Norway). The laboratory includes several scanning electron microscopes (SEM) equipped with EBSD and EDS. These instruments can be used for silicon solar cells, wafers and other energy materials, where one can study the microstructure and the correlation between microstructure and properties. With EBSD we can see the grain orientation, misorientation between different grains, and grain boundary types. With EDS we can run a chemical analysis of a selected area of the sample. There are some limitations in term of sample size and samples preparation is crucial for good results.

Additional information

Technology Readiness Level: 4-6

Special considerations: N/A 

Technology clusters: Energy Storage, Hydrogen, Materials for Energy, Ocean Energy, PV

Website: https://www.ntnu.edu/ima/research/emlab/equipment

Availability: All the year

Provision of tools to prepare data sets in a FAIR way:  No 

Gallery

Contact us


Scroll to Top